Industry fair
> Measurement, Analyses and Tools
> Electromagnetic and electric measurement
> Meaurement
equipment for static measurements on high power semiconductor components :
Thyristors, Diodes, Power semiconductor assembly, GTOs, IGBTs, High power Darlingtons, Triacs, DSASs, Transient suppressors, Varistors …
Version 1 : on state measurements up to 2000A 7V.
Version 2 : off state measurements up to 4000V 10mA,
Gate/Base measurements up to 20V 2A (on short circuit)
Version 3 : visualisation by built-in oscilloscope
6 MODELS AVAIBLE:
LAB 421 ALC Version 1 / LAB 421 ALC Version 1+2 / LAB 421 ALC Version 1+3
LAB 421 ALC Version 2 / LAB 421 ALC Version 2+3 / LAB 421 ALC Version 1+2+3