equipment for static measurements on high power semiconductor components :

Thyristors, Diodes,  Power semiconductor assembly, GTOs, IGBTs, High power Darlingtons, Triacs,  DSASs, Transient suppressors, Varistors …

              Version 1 : on state measurements up to 2000A 7V.
              Version 2 : off state measurements up to 4000V 10mA,
                              Gate/Base measurements up to 20V 2A (on short circuit)
              Version 3 : visualisation by built-in oscilloscope

6 MODELS AVAIBLE:
  LAB 421 ALC Version 1 / LAB 421 ALC Version 1+2 / LAB 421 ALC Version 1+3
  LAB 421 ALC Version 2 / LAB 421 ALC Version 2+3 / LAB 421 ALC Version 1+2+3