LAB 221A

equipment for static measurements on medium power semiconductor components :

IGBTs, Transistors, Darlingtons, MOSFETs, JFETs, SCRs, Triacs, MCTs, Diodes, Zener diodes, Solid state relays, DSASs, Varistors …

Off state measurements up to 2000V 2mA
On state measurements up to 40V 200A (on short circuit)
Gate/Base measurements up to 20V 2A (on short circuit)
Calculation of Gain, RDS(on), IGT VGT

        This tester provides a new solution for manual tests and measurements on discrete semiconductor components. It provides high performances (2000V 200A) at a lower cost than curve-tracers or production testers.
        Applications : Research and development, batch evaluation, incoming inspection, components selection and matching, maintenance, acceptance tests …